DefaultRisk.com the web's biggest credit risk modeling resource.

Home Store Glossary Links Site Guide Search
pp_cdo_16

Up

Submit Your Paper

Post Your Résumé

For Recruiters

Fitch Quantitative Financial Research (QFR)

In Rememberance: World Trade Center (WTC)

Affine Point Processes and Portfolio Credit Risk

by Eymen Errais of Creditex,
Kay Giesecke of Stanford University, and
Lisa R. Goldberg of MSCI Barra

September 15, 2009

Abstract: This paper analyzes a family of multivariate point process models of correlated event timing whose arrival intensity is driven by an a ne jump diffusion. The components of an a ne point process are self- and cross-exciting, and facilitate the description of complex event dependence structures. Ordinary differential equations characterize the transform of an a ne point process and the probability distribution of an integer-valued a ne point process. The moments of an a ne point process take a closed form. This guarantees a high degree of computational tractability in applications. We illustrate this in the context of portfolio credit risk, where the correlation of corporate defaults is the main issue. We consider the valuation of securities exposed to correlated default risk, and demonstrate the significance of our results through market calibration experiments. We show that a simple model variant can capture the default clustering implied by index and tranche market prices during September 2008, a month that witnessed significant volatility.

Keywords: Self-exciting point process, a ne jump diffusion, Hawkes process, transform, portfolio credit derivative, correlated default, index and tranche swap.

Previously titled: Pricing Credit from the Top Down with Affine Point Processes

Books Referenced in this Paper:  (what is this?)

Download paper (324K PDF) 30 pages

CDO books at amazon.com

[Home] [CDO Papers]

Support DefaultRisk.com by shopping at Amazon.com

 

 

Home ] Up ]

Please contact me with problems or suggestions.
Copyright © 2000-2009 DefaultRisk.com
Last modified: July 18, 2009